Hf-based High-k Dielectrics Process Development, Performance Characterization, and Reliability
Lowest Prices
(List: $0.31)
Authors: Young-Hee Kim - Jack Chung-Yeung Lee
ISBN 10: 1598290045
ISBN 13: 9781598290042
Edition:
Published: 2005
Publisher: Morgan & Claypool Publishers
Format: Paperback (92 pages)
ISBN 10: 1598290045
ISBN 13: 9781598290042
Edition:
Published: 2005
Publisher: Morgan & Claypool Publishers
Format: Paperback (92 pages)
Used Books
Seller
Price
Shipping
Total
978-1598290042
Hf-based High-k Dielectrics Process Development, Performance Characterization, and Reliability
Lowest Prices
(List: $0.31)
Authors: Young-Hee Kim - Jack Chung-Yeung Lee
ISBN10: 1598290045 / 1-59829-004-5
ISBN13: 9781598290042 / 978-1-59829-004-2
Edition:
Published: 2005
Publisher: Morgan & Claypool Publishers
Format: Paperback (92 pages)
ISBN1598290045
ISBN9781598290042
ISBN10: 1598290045 / 1-59829-004-5
ISBN13: 9781598290042 / 978-1-59829-004-2
Edition:
Published: 2005
Publisher: Morgan & Claypool Publishers
Format: Paperback (92 pages)
ISBN1598290045
ISBN9781598290042

Click For Details